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FACTORS AFFECTING IMAGE QUALITY FOR MEGAVOLTAGE AND DIAGNOSTIC X-RAY a-Si:H IMAGING ARRAYS

Author(s):
Antonuk, L.E.
Yorkston, J.
Huang, W.
Boudry, J.
Morton, E.J.
Longo, M.J.
Street, R.A.
2 more
Publication title:
Amorphous silicon technology, 1992
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
258
Pub. Year:
1992
Page(from):
1069
Page(to):
1074
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991538 [1558991530]
Language:
English
Call no.:
M23500/258
Type:
Conference Proceedings

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