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COMPARISON OF ELECTRON BEAM-INDUCED AND LIGHT- INDUCED DEFECT SATURATION IN a-Si:H

Author(s):
Grimbergen, M.
Lopez-Otero, A.
Fahrenbruch, A.
Benatar, L.
Redfield, D.
Bube, R.
McConville, R.
2 more
Publication title:
Amorphous silicon technology, 1992
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
258
Pub. Year:
1992
Page(from):
443
Page(to):
448
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991538 [1558991530]
Language:
English
Call no.:
M23500/258
Type:
Conference Proceedings

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