THE STUDY ON MICROSTRUCTURE BY NMR, FTIR, RAMAN CONDUCTIVITY AND OPTICAL BANDGAP IN HYDROGENATED AMORPHOUS SILICON PREPARED BY NOVEL FABRICATION METHODS

THE STUDY ON MICROSTRUCTURE BY NMR, FTIR, RAMAN CONDUCTIVITY AND OPTICAL BANDGAP IN HYDROGENATED AMORPHOUS SILICON PREPARED BY NOVEL FABRICATION METHODS

Author(s):

Publication title:

Amorphous silicon technology, 1992

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

258

Pub. Year:

1992

Page(from):

69

Page(to):

74

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991538 [1558991530]

Language:

English

Call no.:

M23500/258

Type:

Conference Proceedings

Details

TDL ID:	ZA00015742
Series ID:	PA00000011
Conf. info. (Name):	Amorphous Silicon Technology : Symposium
Conf. info. (Number):	1992
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1992.04.27-1992.05.01

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