Blank Cover Image

TEM SAMPLES OF SEMICONDUCTORS PREPARED BY A SMALL-ANGLE CLEAVAGE TECHNIQUE

Author(s):
McCaffrey, J. P.  
Publication title:
Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
254
Pub. Year:
1992
Page(from):
109
Page(to):
120
Pages:
12
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991484 [1558991484]
Language:
English
Call no.:
M23500/254
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The Small-Angle Cleavage Technique: An Update

Walck, Scott D., McCaffrey, John P.

MRS - Materials Research Society
7 Conference Proceedings An Advanced Mechanical Dimpling Technique for the Preparation of TEM Specimens

Fischione, P. E., Howe, J. M.

Materials Research Society
2 Conference Proceedings Preparation of Cross-Sectional TEM Samples of PbTe and CdxPb1-xTe on BaF2

McCaffrey, J. P., Das, S. R., Cook, J. G.

Materials Research Society
8 Conference Proceedings Characterization of Polymer Mixtures by Small Angle X-ray Scattering Techniques

Russell, T. P.

Society of Plastics Engineers, Inc. (SPE)
3 Conference Proceedings Small angle and ultra-small angle scattering techniques for characterization of porous materials

Dore, J. C., North, A. N.

Elsevier
9 Conference Proceedings The TEM Characterization of Low-Dimensional Structures in Epitaxial Semiconductor Thin Films

Gowers P. J.

Plenum Press
4 Conference Proceedings Small-Angle Neutron Scattering From Device-Quality a-Si:H And a-Si:D Prepared By PECVD And HWCVD

Guha, S., Iwaniczko, E., Marr, D. W. M., Nelson, B. P., Williamson, D. L., Yan, B., Yang, J.

Materials Research Society
10 Conference Proceedings RAPID PLAN VIEW FABRICATION OF SEMICONDUCTOR TEM SAMPLES FOR INTERFACE STRAIN AND GRAIN SIZE ANALYSIS

Cole, M.W., Flemish, J.R.

Materials Research Society
5 Conference Proceedings Small-Angle Neutron Scattering Study of Potassium-Doped Tungsten Wire Samples

Grosz, T., Borbely, S., Harmat, P., Ioffe, A., Rosta, L.

Trans Tech Publications
11 Conference Proceedings Determination of the Order Parameter by Quantitative TEM Techniques

Bode, Michael H., Ahrenkiel, S. P., Kurtz, S. R., Bertness, K. A., Arent, D. J., Olson, J.

MRS - Materials Research Society
6 Conference Proceedings Two-View Small-Angle Wedge Sample Preparation by Hand Tools for Transmission Electron Microscopy of Semiconductors and Related Materials

Suder, Suli, Faunce, C. A., Donnelly, S. E.

MRS - Materials Research Society
12 Conference Proceedings Soft electron beam etching for precision TEM sample preparation

Rack, P.D., Thesen, A., Randolph, S., Fowlkes, J.D., Joy, D.C.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12