Blank Cover Image

SURFACE EVOLUTION OF COPOLYMER THIN FILMS AS REVEALED BY ATOMIC FORCE MICROSCOPY

Author(s):
Publication title:
Complex fluids : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
248
Pub. Year:
1992
Page(from):
383
Page(to):
392
Pages:
10
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991422 [1558991425]
Language:
English
Call no.:
M23500/248
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Surface and interface roughness in magnetic thin films: a comparison using carbon-nanotube atomic force microscopy and soft-x-ray scattering

Barnes, B.M., Flack, F., Kelly IV, J.J.G., Lagally, D.P., Savage, D.E., Lagally, M.G.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings A STUDY OF THE SURFACE TEXTURE OF POLYCRYSTALLINE PHOSPHOR FILMS USING ATOMIC FORCE MICROSCOPY

Revay, R., Schneir, J., Brower, D., Villarrubia, J., Fu, J., Cline, J., Hsieh, T. J., Wong-Ng, W.

MRS - Materials Research Society
2 Conference Proceedings Laser conditioning of optical coatings:a statistical study of defects by atomic force microscopy

Fornier,A., Cordillot,C., Bernardino,D., Ausserre,D., Paris,F.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings A Study of the Surface Morphological Features of the Polar Faces of ZnO by Atomic Force Microscopy (AFM) Methods and AlN Thin Films Deposited on ZnO Polar Faces …

Suscavage, M. J., Ryder, D. F., Jr., Yip, P. W.

MRS - Materials Research Society
3 Conference Proceedings Nondestructive film thickness measurement using atomic force microscopy at ultrasonic frequencles

Crozier,K.B., Yaralioglu,G.G., Degertekin,F.L., Adams,J.D., Minne,S.C., Quate,C.F.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Czerwinski,F., Szpunar,J.A.

Trans Tech Publications
4 Conference Proceedings A Technique for Measuring the Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, Using Atomic Force Microscopy

G. Acosta, D.D. Allred, R.C. Davis

Society of Vacuum Coaters
10 Conference Proceedings The Study of the Surface Topography of Microporous Materials Using Atomic Force Microscopy

Occelli, M. L., Gould, S. A. C., Stucky, G. D.

Elsevier
5 Conference Proceedings Nanolithography of polymer surfaces by Atomic Force Microscopy

Blach, J.A., Watson, G.S., Brown, C.L., Pham, D.K., Wright, J.P., Nicolau, D.V., Myhra, S.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Surface Stability of Siderite Under Acidic Atmosphere: An Atomic-Force-Microscopy Study

Weaver, R. M., Grandstaff, D. E., Myer, G. H.

MRS - Materials Research Society
6 Conference Proceedings Thin Film Surface Roughness of Sublimated Aluminum Tris-Hydroquinoline (AlQ₃) versus Growth Rate and Source Configuration via Atomic Force Microscopy

G.L. Smith, T. Dockstader

Society of Vacuum Coaters
12 Conference Proceedings Local Anodic Oxidation of Silicon Surfaces Using Atomic Force Microscopy

Pinto, D. K., dos Santos Fo., S. G.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12