Blank Cover Image

CHARACTERIZATION OF P+-IMPLANTED SILICON

Author(s):
Publication title:
Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
238
Pub. Year:
1992
Page(from):
113
Page(to):
118
Pages:
6
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991323 [1558991328]
Language:
English
Call no.:
M23500/238
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings DEFECTS RELATED TO ELECTRICAL-LEAKAGE IN TMOS STRUCTURES

Knoch, Lynnita, Theodore, N. David, Tam, Pak, Yamamoto, Taku

MRS - Materials Research Society
7 Conference Proceedings Synthesis and Characterization of a New Perovskite Material for SOFC Applications

Gordes, P., Christiansen, N.

Electrochemical Society
2 Conference Proceedings CHARACTERIZATION OF ARSENIC-IMPLANTED AMORPHOUS SILICON

Knoch, L., Theodore, N.D., Tam, G., Pennell, R.

Materials Research Society
8 Conference Proceedings STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF HYDROPHOBIC DIRECT-BONDED SILICON INTERFACES

Tam, Gordon, d'Aragona, Secco, Theodore, N. David

MRS - Materials Research Society
3 Conference Proceedings BEHAVIOR OF DAMAGE IN SELECTIVELY IMPLANTED SiGe/Si

Theodore, N. David, Tam, Gordon, Whitfield, Jim, Christiansen, Jim, Steele, John

MRS - Materials Research Society
9 Conference Proceedings Growth and Characterization of Silicon Nanocrystals Obtained by Ion Implantation

Dias, G. O., Mestanza, S. N. M., Queiroz, J. E. C., Marins, E. S. V. P., Doi, I., Rodriguez, E., Tejero, D. C. B.

Electrochemical Society
4 Conference Proceedings DEFECT-CHARACTERIZATION IN IMPLANTED LOCOS + TRENCH-ISOLATED STRUCTURES

Theodore, N. David, Vasquez, Barbara, Fejes, Peter

Materials Research Society
10 Conference Proceedings MICROSTRUCTURE AND DEFECTS IN IMPLANTED HIPOXSTRUCTURES

David Theodore, N., Pegler, Peter L.

Materials Research Society
5 Conference Proceedings LOW-RESISTIVITY AMORPHOUS SILICON FOR CONTACTS USING LOW-TEMPERATURE RAPID THERMAL ANNEALING

Knoch, L., Tam, G., Theodore, N.D., Pennell, R.

Materials Research Society
11 Conference Proceedings STRESS-RELATED DEFECTS IN IMPLANTED LOCOS + TRENCH-ISOLATED STRUCTURES

Vasquez, Barbara, Theodore, David N.

Materials Research Society
6 Conference Proceedings MICROSTRUCTURAL BEHAVIOR OF POLY-Si IMPLANTED WITH OXYGEN

Theodore, N. David, Huang, WenLing M., Crozier, Peter A.

Materials Research Society
12 Conference Proceedings CHARACTERIZATION OF SPUTTERED Ge FILM

Cho, Jaeshin, Theodore, N. David

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12