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IN-SITU X-RAY REFLECTIVITY STUDY ON GROWTH DYNAMICS OF SPUTTER DEPOSITED GOLD ON SILICON

Author(s):
Chiarello, R. P.
Kim, H. K.
Roberts, T.
Miller, D. J.
Kampwirth, R. T.
Gray, K. E.
You, H.
2 more
Publication title:
Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
237
Pub. Year:
1992
Page(from):
411
Page(to):
416
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991316 [155899131X]
Language:
English
Call no.:
M23500/237
Type:
Conference Proceedings

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