Blank Cover Image

*X-RAY PHOTOELECTRON AND AUGER ELECTRON FORWARD-SCATTERING STUDIES OF THE EPITAXIAL GROWTH OF Fe ON Ag(100)

Author(s):
Egelhoff Jr., William F.  
Publication title:
Structure/property relationships for metal/metal interfaces : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
229
Pub. Year:
1990
Page(from):
27
Page(to):
40
Pages:
14
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991231 [1558991239]
Language:
English
Call no.:
M23500/229
Type:
Conference Proceedings

Similar Items:

Brisard, Gessie M., Zenati, Entissar, Gasteiger, Hubert A., Markovic, Nenad m., Ross, Philip N., Jr.

American Chemical Society

Swartzendruber, L. J., Bennett, L. H., Kief, M. T., Egelhoff, W. F., Jr.

MRS - Materials Research Society

Botez, Cristian E., Elliott, William C., Miceli, Paul F., Stephens, Peter W.

Materials Research Society

Peden, C.H.F., Roger, J.Jr. W., Blair, D.S., Nelson, G.C.

Materials Research Society

Thompson,A.G., Armour,E.A., Collins,D., Zawadzki,P.A., Karlicek,R.F.,Jr., Stall,R.A.

SPIE-The International Society for Optical Engineering

Powell, C.J., Conny, J.M., Jablonski, A.

Electrochemical Society

Stickle, William F., Bomben, Kenneth D.

American Chemical Society

Egelhoff Jr., W. F.

Materials Research Society

Chesters, M. A., Linder, D. R.

Elsevier

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12