MECHANICAL STRESS AND ELECTROMIGRATION FAILURE
- Author(s):
- Lloyd, J. R.
- Publication title:
- Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 225
- Pub. Year:
- 1991
- Page(from):
- 47
- Page(to):
- 52
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991194 [1558991190]
- Language:
- English
- Call no.:
- M23500/225
- Type:
- Conference Proceedings
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