INVESTIGATIONS ON A NEW FAILURE MODEL FOR ELECTROMIGRAT ION
- Author(s):
- Publication title:
- Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 225
- Pub. Year:
- 1991
- Page(from):
- 27
- Page(to):
- 34
- Pages:
- 8
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991194 [1558991190]
- Language:
- English
- Call no.:
- M23500/225
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
American Institute of Chemical Engineers |
Materials Research Society |
American Institute of Chemical Engineers |
MRS - Materials Research Society |
10
Conference Proceedings
(324a) DFT and Parameterized-Model Studies On the Reactivity of Heterogeneous Catalyst Surfaces: Alloying and Coverage Effects
American Institute of Chemical Engineers |
MRS - Materials Research Society |
11
Conference Proceedings
(324a) DFT and Parameterized-Model Studies On the Reactivity of Heterogeneous Catalyst Surfaces: Alloying and Coverage Effects
American Institute of Chemical Engineers |
6
Conference Proceedings
A New FE-Model for the Investigation of Bond Formation and Failure in Roll Bonding Processes
Trans Tech Publications |
12
Conference Proceedings
(324a) DFT and Parameterized-Model Studies On the Reactivity of Heterogeneous Catalyst Surfaces: Alloying and Coverage Effects
American Institute of Chemical Engineers |