ANALYSIS OF THE STRAIN PROFILE IN THIN Au/Ni MULTILAYERS BY X-RAY DIFFRACTION

ANALYSIS OF THE STRAIN PROFILE IN THIN Au/Ni MULTILAYERS BY X-RAY DIFFRACTION

Author(s):

Publication title:

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

208

Pub. Year:

1991

Page(from):

211

Page(to):

218

Pages:

8

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991002 [155899100X]

Language:

English

Call no.:

M23500/208

Type:

Conference Proceedings

Details

TDL ID:	ZA00015692
Series ID:	PA00000011
Conf. info. (Name):	Symposium on advances in surface and thin film diffraction
Conf. info. (Number):	1990
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1990.11.27-1990.11.29

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