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STRUCTURAL DEFECTS IN AMORPHOUS SILICON PROBED BY SUB-PICOSECOND PHOTOCARRIER DYNAMICS

Author(s):
Stolk, P.A.
Roorda, S.
Calcagnile, L.
Sinke, W.C.
van Linden van den Heuvell, H.B.
Saris, F.W.
1 more
Publication title:
Kinetics of phase transformations : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
205
Pub. Year:
1992
Page(from):
15
Page(to):
20
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990975 [1558990976]
Language:
English
Call no.:
M23500/205
Type:
Conference Proceedings

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