CHARACTERTZATION OF GRAIN BOUNDARIES AND INTERFACES BY HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY

CHARACTERTZATION OF GRAIN BOUNDARIES AND INTERFACES BY HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY

Author(s):: Krakow, William
Publication title:: Interfaces between polymers, metals, and ceramics : symposium held April 25-27, 1989, San Diego, California, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 153
Pub. Year:: 1989
Page(from):: 103
Page(to):: 108
Pages:: 6
Pub. info.:: Pittsburgh, Pa.: Materials Research Society
ISSN:: 02729172
ISBN:: 9781558990265 [1558990267]
Language:: English
Call no.:: M23500/153
Type:: Conference Proceedings

Details

TDL ID:	ZA00015675
Series ID:	PA00000011
Conf. info. (Name):	Symposium on interfaces between polymers, metals, and ceramics
Conf. info. (Number):	1989
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1989.04.25-1989.04.27

Similar Items:

1 Conference Proceedings HIGH RESOLUTION ELECTRON MICROSCOPY OF TWIST GRAIN BOUNDARIES Krakow, William Materials Research Society	7 Conference Proceedings EPITAXY OXIDATION AND SURFACE STRUCTURE OF COPPER ON GOLD FILMS BY HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, W., Castano, V. Materials Research Society
2 Conference Proceedings STRUCTURE DETERMINATION OF TILT BOUNDARIES IN GOLD BY HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, William, Smith, David A. Materials Research Society	8 Conference Proceedings High resolution electron microscopy of grain boundaries in silicon Cunningham, B., Ast, D. North-Holland
3 Conference Proceedings ANALYSIS OF OXIDE SURFACES BY HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY Krakow, W., Castano, V. Materials Research Society	9 Conference Proceedings High-Resolution Electron Microscopy of Grain Boundary Migration Merkle, K.L., Thompson, L.J., Phillipp, Fritz Materials Research Society
4 Conference Proceedings HIGH RESOLUTION ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION OF YBa2Cu3O7-X Krakow, William, Shaw, Thomas M. Materials Research Society	10 Conference Proceedings Quantitative High-Resolution Electron Microscopy of Grain Boundaries Campbell, Geoffrey H., King, Wayne E., Cohen, Dov, Carter, C. Barry MRS - Materials Research Society
5 Conference Proceedings Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface Krakow, W. North-Holland	11 Conference Proceedings Detection of point defect chains in ion irradiated silicon by high resolution electron microscopy Krakow, W., Tan, T.Y., Foell, H. North Holland
6 Conference Proceedings CHARACTERIZATION OF TILT BOUNDARIES BY ULTRA HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, W., Wetzel, J. T., Smith, D. A., Trafas, G. Materials Research Society	12 Conference Proceedings QUANTITATIVE HIGH-RESOLUTION ELECTRON MICROSCOPY OF GRAIN BOUNDARIES IN α-Al2O3 Hoche, T., Kenway, P.R., Kleebe, H.-J., Ruhle, M. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12