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MICROWAVE PHOTOCONDUCTIVITY MEASUREMENTS TO CHARACTERIZE SEMICONDUCTORS

Author(s):
Kunst, M.  
Publication title:
Microwave processing of materials II : symposium held April 17-20, 1990, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
189
Pub. Year:
1991
Page(from):
75
Page(to):
80
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990784 [155899078X]
Language:
English
Call no.:
M23500/189
Type:
Conference Proceedings

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