PHOTOREFLECTANCE CHARACTERIZATION OF SILICON FILMS ON INSULATOR
- Author(s):
Giordana, Adraina Glosser, R. Pellegrino, Joseph G. Qadri, S. Twigg, M. E. Richmond, E. D. Joyner, Keith Pollack, Gordon - Publication title:
- Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 188
- Pub. Year:
- 1990
- Page(from):
- 349
- Page(to):
- 354
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990777 [1558990771]
- Language:
- English
- Call no.:
- M23500/188
- Type:
- Conference Proceedings
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