HIGH-RESOLUTION ELECTRON MICROSCOPY OF PLANAR DEFECTS IN AlN

HIGH-RESOLUTION ELECTRON MICROSCOPY OF PLANAR DEFECTS IN AlN

Author(s):

Publication title:

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

183

Pub. Year:

1990

Page(from):

267

Page(to):

272

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990722 [1558990720]

Language:

English

Call no.:

M23500/183

Type:

Conference Proceedings

Details

TDL ID:	ZA00015667
Series ID:	PA00000011
Conf. info. (Name):	Symposium on high resolution electron microscopy of defects in materials
Conf. info. (Number):	1990
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1990.04.16-1990.04.18

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