*DIRECT DEFECT IMAGING IN THE HIGH RESOLUTION SEM
- Author(s):
- Joy, David C.
- Publication title:
- High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 183
- Pub. Year:
- 1990
- Page(from):
- 199
- Page(to):
- 210
- Pages:
- 12
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990722 [1558990720]
- Language:
- English
- Call no.:
- M23500/183
- Type:
- Conference Proceedings
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