*INTERFACE STRUCTURE AND LAYER SYNTHESIS MODES IN MESOTAXIAL Si/CoSi2/Si STRUCTURES
- Author(s):
- Publication title:
- High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 183
- Pub. Year:
- 1990
- Page(from):
- 91
- Page(to):
- 104
- Pages:
- 14
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990722 [1558990720]
- Language:
- English
- Call no.:
- M23500/183
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
*INTERFACIAL STRUCTURE AND EVOLUTION IN MESOTAXIAL CoSi2/Si HETEROSTRUCTURES
Materials Research Society |
Materials Research Society |
Materials Research Society |
Plenum Press |
Materials Research Society |
North Holland |
4
Conference Proceedings
CoSi2/Si(111) INTERFACE STRUCTURE AND ITS INFLUENCE ON THE SCHOTTKY BARRIER
MRS - Materials Research Society |
Materials Research Society |
5
Conference Proceedings
THICKNESS DEPENDENCE OF ELECTRICAL TRANSPORT IN BURIED CoSi2 FILMS FABRICATED BY ION BEAM SYNTHESIS
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
12
Conference Proceedings
EVOLUTION OF BURIED COBALT SILICIDE LAYERS FORMED BY Co IMPLANTATION IN Si(111)
Materials Research Society |