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AN HREM INVESTIGATION INTO THE ATOMIC STRUCTURE OF AN ALUMINUM GRAIN BOUNDARY

Author(s):
Hetherington, C. J. D.
Dahmen, U.
O'Keefe, M. A.
Kilaas, R.
Turner, J.
Westmacott, K. H.
Mills, M. J.
Vitek, V.
3 more
Publication title:
High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
183
Pub. Year:
1990
Page(from):
45
Page(to):
48
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990722 [1558990720]
Language:
English
Call no.:
M23500/183
Type:
Conference Proceedings

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