STUDY OF INTERFACIAL SHARPNESS AND GROWTH IN (GaAs)m(AlAs)n SUPERLATTICES
- Author(s):
Gammon, D. Prokes, S. Katzer, D.S. Shanabrook, B.V. Fatemi, M. Tseng, W. Wilkins, B. Dietrich, H. - Publication title:
- Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 159
- Pub. Year:
- 1990
- Page(from):
- 339
- Page(to):
- 344
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990470 [155899047X]
- Language:
- English
- Call no.:
- M23500/159
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
PERIODICITIES IN THE X-RAY DIFFRACTION OF LOW ORDER AlAs/GaAs SUPERLATTICES
Materials Research Society |
Materials Research Society |
8
Conference Proceedings
INTERFACE ROUGHNESS-INDUCED CHANGES IN THE NEAR-E0 SPECTROSCOPIC BEHAVIOR OF SHORT-PERIOD AlAs/GaAs SUPERLATTICES
MRS - Materials Research Society |
Electrochemical Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
5
Conference Proceedings
Bonded Polycrystalline SiC Substrates for the Growth and Fabrication of GaN FETs
Electrochemical Society |
MRS - Materials Research Society |
Plenum Press |
12
Conference Proceedings
COMPARATIVE STUDY OF INTERFACE STRUCTURE IN GaAs/AlAs SUPERLATTICES BY TEM AND RAMAN SCATTERING
Materials Research Society |