Blank Cover Image

*FOCUSED ION BEAM INDUCED DEPOSITION

Author(s):
Publication title:
Ion beam processing of advanced electronic materials : symposium held April 25-27, 1989, San Diego, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
147
Pub. Year:
1989
Page(from):
127
Page(to):
142
Pages:
16
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990203 [1558990208]
Language:
English
Call no.:
M23500/147
Type:
Conference Proceedings

Similar Items:

Blauner, P.G., Ro, J.S., Butt, Y., Thompson, C.V., Melngailis, J.

Materials Research Society

Langfischer, H., Harasek, S., Wanzenboeck, H. D., Basnar, B., Bertagnolli, E.

Materials Research Society

2 Conference Proceedings Focused Ion Beam Induced Deposition

Melngailis J., Dubner D. A., Ro S. J., Shedd M. G., Lezec H.

Martinus Nijihoff Publishers

Kirch, S.J., Seeger, D.E.

Materials Research Society

Melngailis, John

MRS - Materials Research Society

Hoffmann, P., Utke, I., Cicoira, F., Dwir, B., Leifer, K., Kapon, E., Doppelt, P.

Materials Research Society

4 Conference Proceedings Focused Ion Beam Metrology

Wagner, A., Blauner, P., Longo, P., Cohen, S.

MRS - Materials Research Society

H. Wanzenboeck, M. Fischer, J. Gottsbachner, S. Mueller, W. Brezna, M. Schramboeck, E. Bertagnolli

Electrochemical Society

Ro, J. S., Dubner, A. D., Thompson, C. V., Melngailis, J.

Materials Research Society

11 Conference Proceedings Developments in focused ion beam metrology

Salen,J.A., Athas,G.J., Barnes,D., Bassom,N.J., Yansen,D.E.

SPIE-The International Society for Optical Engineering

Langfischer, H., Harasek, S., Wanzenboeck, H., Lugstein, A., Basnar, B., Bertagnolli, E.

Electrochemical Society

12 Conference Proceedings Focused Ion Beam Etching of GaN

Flierl, C., White, I. H., Kuball, M., Heard, P. J., Allen, G. C., Marinelli, C., Rorison, J. M., Penty, R. V., Chen, Y., …

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12