Blank Cover Image

*STRUCTURE OF HIGHLY PERFECT SEMICONDUCTOR STRAINED LAYER SUPERLATTICES: HIGH-RESOLUTION X-RAY DIFFRACTION AND COMPUTER SIMULATIONS STUDIES

Author(s):
Vandenberg, J. M.  
Publication title:
III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
145
Pub. Year:
1989
Page(from):
455
Page(to):
460
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990180 [1558990186]
Language:
English
Call no.:
M23500/145
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings FORMATION OF NEW INTERFACIAL PHASES IN BIMETALLIC THIN FILM COUPLES STUDIED BY IN-SITU ANNEALING X-RAY DIFFRACTION

Vandenberg, J.M.

Materials Research Society
7 Conference Proceedings Computer simulation of bent perfect crystal diffraction profiles

Sanchez del Rio,M., Ferrero,C., Mocella,V.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Computer Simulation Study of The Properties of Strained Layer Superlattices by TBMD and PPM

Masuda-Jindo, K., Kikuchi, R.

Electrochemical Society
8 Conference Proceedings Temperature -dependent X-ray study of alloyed gold metallization contacts on In1_xGaxAsyP1_y/InP layers

Vandenberg, J., Temkin, H., Hamm, R. A., DiGuiseppe, M. A.

North-Holland
3 Conference Proceedings *STRUCTURAL PERFECTION OF InGaAs/InP SUPERLATTICES GROWN BY GAS SOURCE MOLECULAR BEAM EPITAXY: A HIGH-RESOLUTION X-RAY DIFFRACTION STUDY

vanderberg, J. M., Panish, M. B., Hamm,. R. A.

Materials Research Society
9 Conference Proceedings Study of superficial stress gradients by computer simulation and x-ray diffraction experiment

J. T. Assis, V. I. Monin, S. M. lglesias

Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings Temperature Dependent Characterization of Imbedded InAs Quantum Dots in GaAs Superlattice Solar Cell Structures by High Resolution X-ray Diffraction

Josephine J. Sheng, David C. Chapman, David M. Wilt, Stephen J. Polly, Christopher G. Bailey, Christopher Kerestes, Seth …

Materials Research Society
10 Conference Proceedings *STRAINED LAYER SEMICONDUCTOR FILMS: STRUCTURE AND STABILITY

Feldman, L. C., Bevk, J., Davidson, B. A., Gossman, H.-J., Ourmazd, A., Pearsall, T. P., Zinke-Allmang, M.

Materials Research Society
5 Conference Proceedings X-RAY TOPOGRAPHY AND EBIC STUDIES OF MISFIT DISLOCATIONS IN STRAINED LAYER STRUCTURES

Hamaguchi, N., Humphreys, T. P., Parker, C. A., Bedair, S. M., Jiang, B-L., Radzimski, Z. J., Rozgonyi, G. A.

Materials Research Society
11 Conference Proceedings HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES

Jordan-Sweet, J. L., Mooney, P. M., Stephenson, G. B.

MRS - Materials Research Society
6 Conference Proceedings X-ray Standing Wave and High Resolution Diffraction Study of Si/Ge Superlattices

Lagomarsino, S., Castrucci, P., Calicchia, P., Cedola, A., Kazimirov, A.

MRS - Materials Research Society
12 Conference Proceedings InAs/GaSb superlattices characterized by high-resolution x-ray diffraction and infrared optical spectroscopy

F. Fuchs, N. Herres, J. Schmitz, K.M. Pavlov, J. Wagner

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12