ELECTRICAL & STRUCTURAL PROPERTIES OF TiSi2 FILMS
- Author(s):
- Publication title:
- Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 116
- Pub. Year:
- 1988
- Page(from):
- 459
- Page(to):
- 464
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837869 [0931837863]
- Language:
- English
- Call no.:
- M23500/116
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
TEMPERATURE DEPENDENT CURRENT-VOLTAGE CHARACTERISTICS OF TiSi2/n+/p-Si SHALLOW JUNCTIONS
Materials Research Society |
Materials Research Society |
8
Conference Proceedings
The Effect of TiSi2 Film Thickness and Growth on the Point Defect Perturbance in Si
Electrochemical Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
10
Conference Proceedings
Characterization, Electrical Properties, and Interface Engineering of Sputtered Ba0.5Sr0.5 TiO3 Thin Films for DRAM Applications
Electrochemical Society |
5
Conference Proceedings
Electrical and structural properties of annealed epitaxial CeO2 films on Si(111) substrates
Materials Research Society |
MRS-Materials Research Society |
Materials Research Society |
12
Conference Proceedings
Structural and Optical Properties of CdSe, CdTe and CdSeTe Nanoparticles Dispersed In SiO2 Films
Materials Research Society |