ELECTRICAL, OPTICAL AND STRUCTURAL PROPERTIES OF THIN SiO2 FILMS ON Si

ELECTRICAL, OPTICAL AND STRUCTURAL PROPERTIES OF THIN SiO2 FILMS ON Si

Author(s):

Ravindra, N. M.

Publication title:

SiO[2] and its interfaces : symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

105

Pub. Year:

1988

Page(from):

169

Page(to):

174

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837739 [0931837731]

Language:

English

Call no.:

M23500/105

Type:

Conference Proceedings

Details

TDL ID:	ZA00015591
Series ID:	PA00000011
Conf. info. (Name):	Symposium on SiO2 and its interfaces
Conf. info. (Number):	1987
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1987.11.30-1987.12.05

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