EFFECTS OF SURFACE AND BULK DEFECTS IN InP

EFFECTS OF SURFACE AND BULK DEFECTS IN InP

Author(s):

Publication title:

Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

104

Pub. Year:

1988

Page(from):

491

Page(to):

494

Pages:

4

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837722 [0931837723]

Language:

English

Call no.:

M23500/104

Type:

Conference Proceedings

Details

TDL ID:	ZA00015590
Series ID:	PA00000011
Conf. info. (Name):	Symposium on defects in electronic materials
Conf. info. (Number):	1987
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1987.11.30-1987.12.03

Similar Items:

1 Conference Proceedings HIGH BARRIER HEIGHT MIS DIODES IN n-InP USING Pd, Ni AND Au ON A CHEMICAL OXIDE Lee, Y. S., Anderson, W. A. Materials Research Society	7 Conference Proceedings Sea Surface Temperatures from Infrrared Measurements Singh M. S., Warren E. D. D. Reidel
2 Conference Proceedings PASSIVATION OF SURFACE AND BULK DEFECTS IN InP Balasubramanian, Sathya, Kumar, Vikram, Balasubramanian, N., Premachandran, V. Materials Research Society	8 Conference Proceedings DAMAGE RELATED DEFECT LEVELS IN OXYGEN IMPLANTED GaAs AND InP HE, L., Anderson, W. A. Materials Research Society
3 Conference Proceedings Effects of Polyimide Surface Structure on Liquid Crystal Alignment Lee -W. K., Lien A. S., Paek -H. S., Durning C. Society of Plastics Engineers, Inc. (SPE)	9 Conference Proceedings Effects of Magnetic and Non-Magnetic Impurity Addition on Magnetoresistance Behavior of Lanthanum Manganite Thin Films Kumar, D., Lee, C. B., Pietambaram, S. V., Singh, R. K. Materials Research Society
4 Conference Proceedings PHOTOEMISSION STUDY OF THE PHYSICAL NATURE OF THE InP NEAR-SURFACE DEFECT STATES Chin, K.K., Cao, R., Kendelewicz, T., Miyano, K., Yeh, J.J., Doniach, S., Lindau, I., Spicer, W.E. Materials Research Society	10 Conference Proceedings Silicon Nitride Passivation for InP Based Devices Ren, F., Buckley, N., Lee, K., Pearton, S.J., Bartynski, R.A., Constantine, C., Hobson, W.S., Chao, P.C. Electrochemical Society
5 Conference Proceedings BULK AND SURFACE STRUCTURE OF A TERNARY MICROEMULSION Lee, D. D., Chen, S. H., Satija, S. K., Majkrzak, C. F. MRS - Materials Research Society	11 Conference Proceedings Analysis of Silicon Damage and Surface Contamination Caused by Oxide Etching Reinhardt, K., Busch, E., Kelso, S. Electrochemical Society
6 Conference Proceedings Effects of Process Parameters on the Defect Formation in SOI-ZMR Lee, S.-W., Joo, S.-K. Electrochemical Society	12 Conference Proceedings Non-Alloyed Ohmic Contacts on n-Type InP with Nitridation of Patterned InP Surface Ren, F., Pearton, S. J., Lothian, J.R., Chu, S.N.G., Chu, W.K., Wilson, R.G., Abernathy, C.R., Pei, S. Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12