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CHARACTERIZATION OF INTERFACIAL ROUGHNESS IN SEMICONDUCTOR HETEROSTRUCTURES BY X-RAY REFLECTIVITY

Author(s):
Krol, A.
Sher, C. J.
Resat, H.
Woronick, S. C.
Ng, W.
Kao, Y. H.
Chang, L. L.
Hong, J. M.
3 more
Publication title:
Multilayers : synthesis, properties, and non-electronic applications : symposium held December 2-4, 1987, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
103
Pub. Year:
1988
Page(from):
355
Page(to):
358
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837715 [0931837715]
Language:
English
Call no.:
M23500/103
Type:
Conference Proceedings

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