Blank Cover Image

OBSERVATION OF GaAs/Si INTERFACE BY TEM: EFFECT OF ANNEALING ON THE STRUCTURE

Author(s):
Heral, H.
Rocher, A.
Charasse, M. N.
Georgakilas, A.
Chazelas, J.
Hirtz, J. P.
Blanck, H.
Siejka, J.
3 more
Publication title:
Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
102
Pub. Year:
1988
Page(from):
51
Page(to):
56
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837708 [0931837707]
Language:
English
Call no.:
M23500/102
Type:
Conference Proceedings

Similar Items:

Rocher A., Heral H., Charasse N. M., Georgakilas A., Chazelas J., Hirtz P. J., Blanck H., Siejka J.

Plenum Press

M. Tang, H. Zhang, T.-H. Her

Society of Photo-optical Instrumentation Engineers

Charasse N. M., Bartenlian B., Hirtz P. J., Peugnet A., Chazalas J., Blank H.

Kluwer Academic Publishers

Riepe, K.J., Blanck, H., Doser, W., Auxemery, P., Pons, D.

Electrochemical Society

Rocher, Andre, Wallart, X., Charasse, M. N,

Materials Research Society

Phillips C. C., Vaghjiani L. H., Johnson A. E., Tang P. J. P., Stradling A. R., Harris J. J., Kane J. M.

Kluwer Academic Publishers

Lo, Y. H., Charasse, M.-N., Lee, H., Vakhshoori, D., Huang, Y., Yu. P., Liliental-Weber, Z., Werner, M., Wang, S.

Materials Research Society

Specht, E.D., Ice, G.E., Peters, C.J., Sparks, C.J., Lucas, N., Zhu, X.-M., Moret, R., Morkoc, H.

Materials Research Society

Pribat, D., Mercandalli, L. M., Croset, M., Siejka, J.

North-Holland

Feng, S. L., Bourgoin, J. C., Bardeleben, von H. J., Barbier, E., Hirtz, J. P., Mollot, F.

Materials Research Society

Bourret, Alain, Fuoss, P.H., Rocher, A., Raisin, C.

Materials Research Society

Georgakilas, A., Fatemi, M., Fotiadis, L., Christou, A.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12