INVESTIGATION OF INTERFACE STATES ON MBE CoSi2/Si SCHOTTKY CONTACTS BY FORWARD BIAS CAPACITANCE MEASUREMENT
- Author(s):
- Publication title:
- Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 91
- Pub. Year:
- 1987
- Page(from):
- 439
- Page(to):
- 444
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837586 [0931837588]
- Language:
- English
- Call no.:
- M23500/91
- Type:
- Conference Proceedings
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