Blank Cover Image

STRUCTURAL CHARACTERIZATION OF THIN METAL OVERLAYERS BY X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING

Author(s):
Egelhoff Jr., W. F.  
Publication title:
Physical and chemical properties of thin metal overlayers and alloy surfaces : symposium held December 3-5, 1986, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
83
Pub. Year:
1987
Page(from):
189
Page(to):
198
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837487 [0931837480]
Language:
English
Call no.:
M23500/83
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings *X-RAY PHOTOELECTRON AND AUGER ELECTRON FORWARD-SCATTERING STUDIES OF THE EPITAXIAL GROWTH OF Fe ON Ag(100)

Egelhoff Jr., William F.

Materials Research Society
7 Conference Proceedings THE EFFECT OF ADSORBED OXYGEN IONS ON THE INELASTIC SCATTERING OF PHOTOELECTRONS AT THE METAL-VACUUM INTERFACE

Pong, W., Brandt, D., He, Z. X.I, Imaino, W.

Materials Research Society
2 Conference Proceedings THE XPS SEARCHLIGHT EFFECT: A NEW ANALYTICAL TOOL FOR LAYERED STRUCTURES, EPITAXY AND INTERFACES

Egelhoff Jr., W. F.

Materials Research Society
8 Conference Proceedings A novel low-cost high-throughput probe card scanner analyzer for characterization of magnetic tunnel junctions

P. W. T. Pong, M. Schmoueli, E. Marcus, W. F. Egelhoff, Jr.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings AUGER ELECTRON AND PHOTOELECTRON DIFFRACTION IN MAGNETIC THIN FILMS

Idzerda, Y. U., Ramaker, D. E.

MRS - Materials Research Society
9 Conference Proceedings STRUCTURAL CHARACTERIZATION OF Ga ON Si(112) BY AUGER ELECTRON DIFFRACTION

Yater, J. E., Shih, A., Idzerda, Y. U.

MRS - Materials Research Society
4 Conference Proceedings Characterization of SiC Fibers by Soft X-ray Photoelectron and Photoabsorption Spectroscopies and Scanning Auger Microscopy

Ma, Qing, McDowell, M. W., Rosenberg, R. A.

MRS - Materials Research Society
10 Conference Proceedings "Structural, infrared, x-ray photoelectron, and Raman spectral characterization of electrochromic nickel oxide films"

Wu,Y., Wu,G., Ni,X., Wu,X.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy

Powell, C.J., Conny, J.M., Jablonski, A.

Electrochemical Society
11 Conference Proceedings Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction

D'Acapito,F., Thiaudiere,D., Zontone,F., Regnard,J.R.

Trans Tech Publications
6 Conference Proceedings METAL OVERLAYERS ON SELF-ORGANIZED MOLECULAR ASSEMBLIES: X-RAY PHOTOELECTRON SPECTROSCOPY OF Cr/CN AND Ni/CN ON 12-MERCAPTODODECANENITRILE

Jung, D. R., Czanderna, A. W.

MRS - Materials Research Society
12 Conference Proceedings X-ray photoelectron spectroscopy and scanning tunneling microscopy studies of thin anodic oxide overlayers on metal and alloy single-crystal surfaces

Marcus, P., Maurice, V.

American Chemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12