*CORRELATION OF ELECTRICAL PROPERTIES WITH STRUCTURE IMAGING OF SEMICONDUCTOR INTERFACES
- Author(s):
- Publication title:
- Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 82
- Pub. Year:
- 1987
- Page(from):
- 335
- Page(to):
- 348
- Pages:
- 14
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837470 [0931837472]
- Language:
- English
- Call no.:
- M23500/82
- Type:
- Conference Proceedings
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