STUDY OF ION IMPLANTED COPPER LASER MIRRORS BY SPECTROSCOPIC ELLIPSOMETRY

STUDY OF ION IMPLANTED COPPER LASER MIRRORS BY SPECTROSCOPIC ELLIPSOMETRY

Author(s):

Snyder, P.G.

Publication title:

Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

74

Pub. Year:

1987

Page(from):

535

Page(to):

542

Pages:

8

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837401 [0931837405]

Language:

English

Call no.:

M23500/74

Type:

Conference Proceedings

Details

TDL ID:	ZA00015559
Series ID:	PA00000011
Conf. info. (Name):	Symposium on beam-solid interactions and transient processes
Conf. info. (Number):	1986
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1986.12.01-1986.12.04

Similar Items:

1 Conference Proceedings COMPARATIVE THICKNESS MEASUREMENTS OF HETEROJUNCTION LAYERS BY ELLIPSOMETRIC, RBS, AND XTEM ANALYSIS Woollam, J.A., Snyder, P.G., McCormick, A.W., Rai, A.K., Ingram, D.C., Pronko, P.P., Geddes, J.J. Materials Research Society	7 Conference Proceedings VARIABLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRIC STUDY OF SEMICONDUCTOR MULTILAYER STRUCTURES Snyder, P.G., Woollam, J.A., Alterovitz, S.A. Materials Research Society
2 Conference Proceedings ION IRRADIATION SMOOTHING AND FILM BONOIMG FOR LASER MIRRORS Pronko, P. P., McCormick, A. W., Ingram, D. C., Rai, A. K., Woollam, J. A., Appleton, B. R., Poker, D. B. North-Holland	8 Conference Proceedings CHARACTERIZATION OF AN ASYMMETRIC TRIANGULAR MULTIPLE QUANTUM WELL, BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY Herzinger, Craig M., Snyder, Paul G., Woollam, John A., Evans, Keith, Stutz, C.E., Jones, R., Merkel, K.G., Reynolds, … Materials Research Society
3 Conference Proceedings DEPTH PROFILING OF HYDROGEN IN ION-IMPLANTED POLYMERS Carlson, J. D., Pronko, P. P., Ingram, D. C. North-Holland	9 Conference Proceedings Diamondlike Carbon Applications in Infrared Optics and Microelectronics Woollam,J.A., De,B.N., Orzeszko,S., Ianno,N.J., Snyder,P.G., Alterovitz,S.A., Pouch,J.J., Wu,R.L.C., Ingram,D.C. Trans Tech Publications
4 Conference Proceedings SUPERLATTICE OPTICAL PROPERTIES MEASURED BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY Snyder, P. G., Merkel, K. G., De, B. N., Woollam, J. A., Langer, D. W., Stutz, C. E., Jones, R., Rai, A. K., Evans, K. Materials Research Society	10 Conference Proceedings IN SITU STUDIES OF ELECTRON CYCLOTRON RESONANCE PLASMA ETCHING OF SEMICONDUCTORS BY SPECTROSCOPIC ELLIPSOMETRY Nafis, S., Ianno, N.J., Snyder, Paul G., Woollam, John A., Johs, Blaine Materials Research Society
5 Conference Proceedings *VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE FOR THE STUDY OF ION-BEAM -AND GROWTH MODIFIED SOLIDS Woollam, John A., Snyder, Paul G., Rost, M. C. Materials Research Society	11 Conference Proceedings THE STUDY OF DAMAGE PROFILE OF THE ION-IMPLANTED LAYER ON SILICON BY SPECTROSCOPIC ELLIPSOMETRY Luo, J., McMarr, P. J, Vedam,K. North-Holland
6 Technical Paper Study of InGaAs Based MODEFET Structures Using Variable Angle Spectroscopic Ellipsometry Alterovitz, S.A., Sieg, R.M., Yao, H.D., Snyder, P.G., Woollam, J.A., Pamulapati, J., Bhattacharya, P.K., Sekula-Moise, … National Aeronautics and Space Adminstration	12 Conference Proceedings GaAs(100) SURFACE MODIFICATIONS AT ELEVATED TEMPERATURES, STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY Yao, Huade, Snyder, Paul G., Woollam, John A. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12