QUANTITATIVE MATERIALS ANALYSIS BY LASER MICROPROBE MASS ANALYSIS
- Author(s):
- Publication title:
- Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 69
- Pub. Year:
- 1986
- Page(from):
- 265
- Page(to):
- 274
- Pages:
- 10
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837357 [0931837359]
- Language:
- English
- Call no.:
- M23500/69
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
MICROPROBE ANALYSIS OF NANOPHASE METAL-OXIDES USING INELASTIC LIGHT SCATTERING
Materials Research Society |
Materials Research Society |
Electrochemical Society |
8
Conference Proceedings
Ocular scanning instrumentation: rapid diagnosis of chemical threat agent exposure
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Plenum Press |
Electrochemical Society |
5
Conference Proceedings
HIGH SENSITIVITY SURFACE ANALYSIS OF SILICON WAFERS BY TIME-OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)
Electrochemical Society |
11
Conference Proceedings
Direct Surface Analysis of Organic Contamination for Semiconductor Related Materials
MRS - Materials Research Society |
6
Conference Proceedings
Spectroscopic studies of pulsed-laser-induced damage sites in heated CaF2 crystals
SPIE - The International Society for Optical Engineering |
Materials Research Society |