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CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY STUDY OF OBLIQUELY EVAPORATED SILICON OXIDE THIN FILMS

Author(s):
Publication title:
Defects in glasses : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
61
Pub. Year:
1986
Page(from):
367
Page(to):
374
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837265 [093183726X]
Language:
English
Call no.:
M23500/61
Type:
Conference Proceedings

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