X-RAY DIFFRACTION CHARACTERIZATION OF ELASTIC STRAIN IN COMPOSITION MODULATED LAYERED STRUCTURES

X-RAY DIFFRACTION CHARACTERIZATION OF ELASTIC STRAIN IN COMPOSITION MODULATED LAYERED STRUCTURES

Author(s):

Publication title:

Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

56

Pub. Year:

1985

Page(from):

447

Page(to):

454

Pages:

8

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837210 [0931837219]

Language:

English

Call no.:

M23500/56

Type:

Conference Proceedings

Details

TDL ID:	ZA00015542
Series ID:	PA00000011
Conf. info. (Name):	Symposium on layered structures and epitaxy
Conf. info. (Number):	1985
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1985.12.02-1985.12.04

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