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STRUCTURAL CHARACTERIZATION AND SCHOTTKY BARRIER HEIGHT MEASUREMENTS OF EPITAXIAL NiSi2 ON Si

Author(s):
Hunt, B.D.
Schowalter, L.J.
Lewis, N.
Hall, E.L.
Hauenstein, R.J.
Schlesinger, T.E.
McGill, T.C.
Okamoto,Masako
Hashimoto, Shin
4 more
Publication title:
Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
54
Pub. Year:
1985
Page(from):
479
Page(to):
484
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837197 [0931837197]
Language:
English
Call no.:
M23500/54
Type:
Conference Proceedings

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