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FORMATION OF NEW INTERFACIAL PHASES IN BIMETALLIC THIN FILM COUPLES STUDIED BY IN-SITU ANNEALING X-RAY DIFFRACTION

Author(s):
Vandenberg, J.M.  
Publication title:
Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
54
Pub. Year:
1985
Page(from):
171
Page(to):
174
Pages:
4
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837197 [0931837197]
Language:
English
Call no.:
M23500/54
Type:
Conference Proceedings

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