CRYSTALLIZATION OF AMORPHOUS TUNGSTEN DISILICIDE: STACKING FAULTS AND RESISTIVITY
- Author(s):
- Publication title:
- Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 54
- Pub. Year:
- 1985
- Page(from):
- 51
- Page(to):
- 56
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837197 [0931837197]
- Language:
- English
- Call no.:
- M23500/54
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
Materials Research Society |
2
Conference Proceedings
Interface Reactions with Formation of a Solid Phase on a Solid Substrate:A Short Overview
Trans Tech Publications |
8
Conference Proceedings
In Situ Monitoring of Thin Film Reactions During Rapid Thermal Annealing: Nickel Silicide Formation
Electrochemical Society |
3
Conference Proceedings
FORMATION OF BURIED TiSi2 LAYERS IN SINGLE CRYSTAL SILICON BY ION IMPLANTATION
Materials Research Society |
Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |
5
Conference Proceedings
Nucleation phenomena in transitions from two to three phases, diffusion couples, phase stability, the thin film formation of some silicides
North-Holland |
11
Conference Proceedings
HYDROGEN SEGREGATION AT THE A1/Si INTERFACE STUDIED USING A NUCLEAR RESONANT REACTION
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |