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COMPARISON OF PERFORMANCE OF AN ANALYTICAL ELECTRON MICROSCOPE AT 300 AND 100 KV

Author(s):
Bentley, J.
Kenik, E. A.
Angelini, P.
Fisher, A. T.
Sklad, P. S.
Lehman, G. L.
Horton Jr., J. A.
2 more
Publication title:
Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
41
Pub. Year:
1985
Page(from):
363
Page(to):
368
Pages:
6
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9780931837067 [0931837065]
Language:
English
Call no.:
M23500/41
Type:
Conference Proceedings

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