Blank Cover Image

CONCENTRATION MEASUREMENTS AND DEPTH PROFILING OF PHOSPHORUS AND BORON BY MEANS OF (p, ) RESONANT REACTIONS

Author(s):
Publication title:
Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
48
Pub. Year:
1985
Page(from):
409
Page(to):
418
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837135 [0931837138]
Language:
English
Call no.:
M23500/48
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings PHOSPHOUS AND BORON DOPING OF a-Si : H : EFFECTS OF DEPOSITION TEMPERATURE

Pruppers, M. J.. M., Maessen, K. H. M., Bezemer, J., Habraken, F. H.. P. M., van der Weg, W. F.

Materials Research Society
7 Conference Proceedings Interfacial reactions of transition metal oxides on aluminium oxide studied by high-energy ion beam analysis techniques

Bolt, P. H., Habraken, F. H. P. M., Geus, J. W.

Elsevier
2 Conference Proceedings HYDROGEN CONTENT AND THE OPTICAL BANDGAP IN AMORPHOUS SILICON

Maessen, K. H. M., Pruppers, M. J.. M., Bezemer, J., Habraken, F. H.. P. M., van der Weg, W. F.

Materials Research Society
8 Conference Proceedings *THE MEASUREMENT OF BORON AT SILICON WAFER SURFACES BY NEUTRON DEPTH PROFILING

Downing, R.G., Lavine, J.P., Hossain, T.Z., Russell, J.B., Zenner, G.P.

Materials Research Society
3 Conference Proceedings HYDROGEN INCORPORATION IN a-Si:H: TEMPERATURE AND DOPING TYPE DEPENDENCE

Pruppers, M. J. M., Maessen, K. M. H., Habraken, F. H. P. M., Bezemer, J., Weg, Van der W. F.

Materials Research Society
9 Conference Proceedings DEACTIVATION OF ALUMINA SUPPORTED CATALYSTS DUE TO SPINEL FORMATION

Bolt, P. H., Ipenburg, M. E. Van, Geus, J. W., Habraken, F. H. P. M.

MRS - Materials Research Society
4 Conference Proceedings Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling

Unlu, K., Wehring, B.W., Hossain, T.Z., Lowell, J.K.

Electrochemical Society
10 Conference Proceedings Application of Elastic Recoil Detection in Materials Analysis

Arnoldbik M. W., Habraken M. P. H. F.

Kluwer Academic Publishers
5 Conference Proceedings Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling

Unlu,K., Wehring,B.W., Hossain,T.Z., Lowell,J.K.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Neutron depth profiling of elemental concentration using a focused beam

Chen-Mayer,H.H., Lamaze,G.P., Mildner,D.F.R., Downing,R.G.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Depth Profiles of Medium Energy Phosphorus Implants into Silicon

Lavine, J. P., Zheng, L., Whalen, P. M., Downey, D. F.

MRS - Materials Research Society
12 Conference Proceedings Positron Depth-Profiling of Polymer Interfaces

Gidley,D.W., DeMaggio,G.B., Frieze,W.E., Zhu,M., Hristov,H.A., Yee,A.F.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12