Blank Cover Image

*DEFECT STRUCTURE AND PROPERTIES BY JUNCTION SPECTROSCOPY

Author(s):
Publication title:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
46
Pub. Year:
1985
Page(from):
3
Page(to):
12
Pages:
10
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837111 [0931837111]
Language:
English
Call no.:
M23500/46
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Defect characterization by junction spectroscopy

Kimerling, L.C.

North Holland
7 Conference Proceedings Interstitial Defect Reactions in Silicon

Kimerling,L.C., Asom,M.T., Benton,J.L., Drevinski,P.J., Caefer,C.E.

Trans Tech Publications
2 Conference Proceedings Structure and Properties of Point Defects in Semiconductors

Kimerling C. L.

Plenum Press
8 Conference Proceedings Defect Engineering for Silicon Microphotonics

Agarwal, A., Foresi, J.S., Giovane, L.M., Liao, L., Michel, J., Wada, K., Kimerling, L.C.

Electrochemical Society
3 Conference Proceedings Interstitial Defect Reactions in Silicon

Zhao, S., Agarwal, A. M., Benton, J. L., Gilmer, G. H., Kimerling, L. C.

MRS - Materials Research Society
9 Conference Proceedings Defects and Future Silicon Technology

Palm, J., Kimerling, L. C.

MRS - Materials Research Society
4 Conference Proceedings NEW IMPURITY-DEFECT REACTIONS IN SILICON.

CHANTRE,A., BENTON,J.L., ASOM,M.T., KIMERLING,L.C.

Trans Tech Publications
10 Conference Proceedings METASTABLE DEFECT CONFIGURATIONS IN SEMICONDUCTORS,

Benton, J. L., Levinson, M.

North-Holland
5 Conference Proceedings THE EFFECT OF UNIAXIAL STRESS ON THE INFRARED ABSORPTION BANDS DUE TO THE OXYGEN DONOR IN SILICON

Stavola, M., Lee, K. M., Freeland, P.E., Kimerling, L. C.

Materials Research Society
11 Conference Proceedings AN ODMR STUDY OF THE KILLER CENTER Fe IN GaP:O

Lee, K. M, Kimerling, L C., Sturge, M. D.

Materials Research Society
6 Conference Proceedings IDENTIFICATION OF INTERSTITIAL CARBON RELATED DEFECTS IN SILICON

Benton, J. L., Asom, M. T., Sauer, R., Kimerling, L. C.

Materials Research Society
12 Conference Proceedings Hydrogen-Containing Point Defects in Silicon

Stavola, M.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12