SPECTROSCOPIC ELLIPSOMETRY STUDY OF RF-SPUTTERED a-Ge FILMS

SPECTROSCOPIC ELLIPSOMETRY STUDY OF RF-SPUTTERED a-Ge FILMS

Author(s):

Publication title:

Plasma synthesis and etching of electronic materials : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

38

Pub. Year:

1985

Page(from):

301

Page(to):

308

Pages:

8

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837036 [0931837030]

Language:

English

Call no.:

M23500/38

Type:

Conference Proceedings

Details

TDL ID:	ZA00015524
Series ID:	PA00000011
Conf. info. (Name):	Symposium on plasma synthesis and etching of electronic materials
Conf. info. (Number):	1984
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1984.11.26-1984.11.30

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