SPECULAR SCATTERING IN ELECTRICAL TRANSPORT IN THE THIN FILM SYSTEM CoSi2/Si
- Author(s):
- Publication title:
- Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 37
- Pub. Year:
- 1985
- Page(from):
- 355
- Page(to):
- 360
- Pages:
- 6
- Pub. info.:
- Pittsburgh: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837029 [0931837022]
- Language:
- English
- Call no.:
- M23500/37
- Type:
- Conference Proceedings
Similar Items:
North-Holland |
Plenum Press |
Materials Research Society |
Materials Research Society |
3
Conference Proceedings
ELECTRICAL TRANSPORT AND IN-SITU X-RAY STUDIES OF THE FORMATION OF TiSi2 THIN FILMS ON Si
Materials Research Society |
MRS - Materials Research Society |
North-Holland |
Materials Research Society |
Materials Research Society |
Materials Research Society |
6
Conference Proceedings
THE EFFECT OF FORMATION CONDITIONS ON THE STRUCTURAL AND ELECTRICAL PROPERTIES OF ULTRATHIN COBALT SILICIDE FILMS
Materials Research Society |
12
Conference Proceedings
STUDIES OF THE EFFECT OF RAPID THERMAL ANNEALING ON THE STRUCTURAL AND ELECTRICAL PROPERTIES OF THE HETEROEPITAXIAL CaF2/CoSi2/Si(111) STRUCTURES
Materials Research Society |