Blank Cover Image

TRANSMISSION ELECTRON MICROSCOPY OF STRAINED-LAYER SUPERLATTICES

Author(s):
Publication title:
Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
37
Pub. Year:
1985
Page(from):
267
Page(to):
274
Pages:
8
Pub. info.:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9780931837029 [0931837022]
Language:
English
Call no.:
M23500/37
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings PROPAGATION OF DISLOCATIONS THROUGH GeSi/Si STRAINED LAYERS AND SUPERLATTICES

Hull, R., Bean, J.C., Leibenguth, R.E.

Materials Research Society
7 Conference Proceedings MEASUREMENT OF THE BANDGAP OF GexSil-x/Si STRAINED-LAYER HETEROSTRUCTURES

Lang, D.V., People, R., Bean, J.C., Sergent, A.M.

Materials Research Society
2 Conference Proceedings INTERFACIAL STRUCTURE AND STABILITY IN GeXSil-X/Si STRAINED LAYERS

Hull, R., Bean, J. C., Gibson, J. M., Marcantonio, K. J., Fiory, A. T., Nakahara, S.

Materials Research Society
8 Conference Proceedings IN-SITU TRANSMISSION ELECTRON MICROSCOPY STUDIES OF THE OXIDATION OF Si(111) 7x7

Gibson, J.M.

Materials Research Society
3 Conference Proceedings MOLECULAR BEAM EPITAXY OF GeXSil-X /(Si,Ge) STRAINED-LAYER HETEROSTRUCTUES AND SUPERLATTICES

Bean, J. C.

Materials Research Society
9 Conference Proceedings Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces

Gibson M. J.

Plenum Press
4 Conference Proceedings *THE ROLES OF STRESS, GEOMETRY AND ORIENTATION ON MISFIT DISLOCATIONS KINETICS AND ENERGETICS IN EPITAXIAL STRAINED LAYERS

Hull, R., Bean, J. C., Ross, F., Bahnck, D., Peticolas, L. J.

Materials Research Society
10 Conference Proceedings Atomic Number Imaging of Supported Catalyst Particles by Scanning Transmission Electron Microscope

Treacy, M. M. J.

American Chemical Society
5 Conference Proceedings Experimental Methods and Data Analysis for Fluctuation Microscopy

Abelson, J. R., Gibson, J. M., Jin, H-C., Treacy, M. M. J., Voyles, P. M.

Materials Research Society
11 Conference Proceedings TRAPPING OF OXYGEN AT HOMOEPITAXIAL Si/Si INTERFACES GROWTH BY MODULAR BEAM EPITAXY

Hull, R., Twigg, M.E., Bean, J.C., Gibson J.M., Joy, D.C.

Materials Research Society
6 Conference Proceedings SURFACE STUDIES OF SILICON WITH A HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE

Gibson, J.M., McDonald, M.L., Unterwald, F.C., Gossmann, H.-J., Bean, J.C., Tung, R.T.

Materials Research Society
12 Conference Proceedings EXPERIMENTAL AND THEORETICAL ANALYSIS OF STRAIN RELAXATION IN GeXSi1-X/Si(100) HETEROEPITAXY

Hull, R., Bean, J. C.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12