CORRELATION OF Si-SiO2 INTERFACE ROUGHNESS WITH MOSFET CARRIER MOBILITY
- Author(s):
- Publication title:
- Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 37
- Pub. Year:
- 1985
- Page(from):
- 193
- Page(to):
- 198
- Pages:
- 6
- Pub. info.:
- Pittsburgh: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837029 [0931837022]
- Language:
- English
- Call no.:
- M23500/37
- Type:
- Conference Proceedings
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