Blank Cover Image

DEPTH PROFILING OF HYDROGEN IN ION-IMPLANTED POLYMERS

Author(s):
Publication title:
Ion implantation and ion beam processing of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
27
Pub. Year:
1984
Page(from):
455
Page(to):
460
Pages:
6
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008695 [0444008691]
Language:
English
Call no.:
M23500/27
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings STUDY OF ION IMPLANTED COPPER LASER MIRRORS BY SPECTROSCOPIC ELLIPSOMETRY

Snyder, P.G., Massengale, A., Memarzadeh, K., Woollam, J.A., Ingram, D.C., Pronko, P.P.

Materials Research Society
7 Conference Proceedings AES Depth Profiles of Nitrogen Ion Implanted Austenitic Stainless Steel

Aggarwal,S., Mohindra,R.K., Ghosh,P.K., Bhatnagar,M.C.

Trans Tech Publications
2 Conference Proceedings ATOMIC PROFILES OF HIGH ENERGY (MeV) Si IMPLANTED INTO GaAs

Thompson, Phillip E., Wilson, Robert G., Ingram, David C, Pronko, Peter P.

Materials Research Society
8 Conference Proceedings DEFECT LEVELS IN THE NEAR-SURFACE REGION OF 2.0 MeV 16O+ ION IMPLANTED n-GaAs

Tin, C.C., Barnes, P.A., Bardin, T.T., Pronko, J.G.

Materials Research Society
3 Conference Proceedings ION IRRADIATION SMOOTHING AND FILM BONOIMG FOR LASER MIRRORS

Pronko, P. P., McCormick, A. W., Ingram, D. C., Rai, A. K., Woollam, J. A., Appleton, B. R., Poker, D. B.

North-Holland
9 Conference Proceedings Confocal Raman microscopy for depth profiling of polymer/polymer and polymer/glass interfaces

Sammon,C., Eaton,P., Mura,C., Yarwood,J.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings BROAD AND FOCUSED ION BEAM Ga+ IMPLANTATION DAMAGE IN THE FABRICATION OF p+-nSi SHALLOW JUNCTIONS

Steckl, A. J., Lin, C-M., Patrizio, D., Rai, A. K., Pronko, P P..

Materials Research Society
10 Conference Proceedings DETAILS OF THE DEFECT PROFILE IN SELF-ION IMPLANTED SILICON

Zhang, P. X., Goldberg, R. D., Mitchell, I. V., Schultz, P. J., Lockwood, D. J.

MRS - Materials Research Society
5 Conference Proceedings Depth Profiles of Medium Energy Phosphorus Implants into Silicon

Lavine, J. P., Zheng, L., Whalen, P. M., Downey, D. F.

MRS - Materials Research Society
11 Conference Proceedings COMPARATIVE THICKNESS MEASUREMENTS OF HETEROJUNCTION LAYERS BY ELLIPSOMETRIC, RBS, AND XTEM ANALYSIS

Woollam, J.A., Snyder, P.G., McCormick, A.W., Rai, A.K., Ingram, D.C., Pronko, P.P., Geddes, J.J.

Materials Research Society
6 Conference Proceedings Depth profile characterization of hydrogen implanted silicon using spectroscopic ellipsometry

Gubiotti, T., Jacy, D., Hoobler, R.J.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Hardness Depth Profiling Of Ion-Implanted Polymer Thin Films

Suchaneck, Gunnar, Wolf, Bodo, Guenther, Margarita, Gerlach, Gerald

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12