Blank Cover Image

Electromigration in Al and Al-alloy thin-film conductors

Author(s):
Publication title:
Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
25
Pub. Year:
1984
Page(from):
581
Page(to):
586
Pages:
6
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444009050 [0444009051]
Language:
English
Call no.:
M23500/25
Type:
Conference Proceedings

Similar Items:

Kisselgof, Larisa, Elliott, L. J., Maziarz, J. J., Lloyd, J. R.

Materials Research Society

I.K. Bdikin, M. Silibin, R. Ayouchi, R. Schwarz, S. Gavrilov, J. Gracio, A.L. Kholkin

Materials Research Society

Lloyd, J. R.

Materials Research Society

Du, X. D., Venkatesan, T., Inam, A., Xi, X. X., Li, Q., McLean, W. L., Chang, C. C., Hwang, D. M., Ramesh, R., Nazar, …

Materials Research Society

SCHWARTZ, J. A., FELTON, L. E.

American Institute of Chemical Engineers

Gladkikh, A., Lereah, Y., Karpovski, M., Palevski, A., Kaganovskii, Yu. S.

MRS - Materials Research Society

Mockl, U. E., Lloyd, J. R., Arzt, E.

MRS - Materials Research Society

Gladkikh, A., Lereah, Y., Karpovski, M., Palevski, A., Kaganovskii, Yu, S.

MRS - Materials Research Society

Lloyd, J. R., Smith, P. M., Prokop, G. S.

North-Holland

Ross, R. A.

Materials Research Society

Frear, D. R., Michael, J. R., Romig, A. D., Jr.

MRS - Materials Research Society

Chang, C. Y., Vook, R. W.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12