THE INTERFACE STRUCTURE OF GRAIN BOUNDARIES IN POLYSILICON

THE INTERFACE STRUCTURE OF GRAIN BOUNDARIES IN POLYSILICON

Author(s):

Johnson, S. M. ( Solarex Corporation Rockville, MD; )
Yoo, K. C.
Lin, H. C. ( University of Maryland, College Park, MD; )
Rosemeier, R. G.
Soltani, P. ( Semix, Inc. Gaithersburg, MD )

Publication title:

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

14

Pub. Year:

1983

Page(from):

357

Page(to):

362

Pages:

6

Pub. info.:

New York: North-Holland

ISSN:

02729172

ISBN:

9780444008121 [0444008128]

Language:

English

Call no.:

M23500/14

Type:

Conference Proceedings

Details

TDL ID:	ZA00015498
Series ID:	PA00000011
Conf. info. (Name):	Symposium on defects in semiconductors
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1982.11.00

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