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(15.3) 1:50 - 2:10 PM - The Impact of Strained-Si/SiGe Heterostructure Dislocations on the Electrical Activity of Defects

Author(s):
Czerwinski, A.
Kordas, L.
Bray, K.R.
Zhao, W.
Wise, R.
Rozgonyi, G. A. (NC St. Univ.)
1 more
Publication title:
SiGe: materials, processing, and devices : proceedings of the First international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2004-07
Pub. Year:
2004
Page(from):
961
Page(to):
972
Pages:
12
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774208 [1566774209]
Language:
English
Call no.:
E23400/200407
Type:
Conference Proceedings

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