Reliability Challenges for sub-90nm Technology Dielectrics
- Author(s):
- Puchner, H.
- Publication title:
- Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2004-04
- Pub. Year:
- 2004
- Page(from):
- 239
- Page(to):
- 249
- Pages:
- 11
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774178 [1566774179]
- Language:
- English
- Call no.:
- E23400/200404
- Type:
- Conference Proceedings
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