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Silicon Wafer Bonding Using Deposited and Thermal Oxides: A Comparative Study

Author(s):
Radu, I.
Singh, R.
Reiche, M.
Gosele U.
Kuck, B.
Grabolla, T.
Tillack, B.
Christiansen, S.
3 more
Publication title:
Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-02
Pub. Year:
2005
Page(from):
400
Page(to):
405
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774604 [1566774608]
Language:
English
Call no.:
E23400/200502
Type:
Conference Proceedings

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